Zobrazeno 1 - 2
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pro vyhledávání: '"Xu, Yadong"'
Publikováno v:
Journal of Semiconductors. 34:043003
A laser scanning confocal microscope (LSCM) and a field-emission scanning electron microscope (FE-SEM) were used to study the defects in CdMnTe crystals, such as twin boundaries, Te inclusions, and dislocations. Twin boundaries were usually decorated
Publikováno v:
Journal of Semiconductors. 30:082002
To evaluate the charge transport properties of as-grown high resistivity CdZnTe crystals doped with In/Al, the α particle spectroscopic response was measured using an un-collimated 241Am (5.48 MeV) radioactive source at room temperature. The electro