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Publikováno v:
Journal of Semiconductors. 36:111001
As technology feature sizes decrease, single event upset (SEU), and single event transient (SET) dominate the radiation response of microcircuits. Multiple bit upset (MBU) (or multi cell upset) effects, digital single event transient (DSET) and analo
Publikováno v:
Journal of Semiconductors; Nov2015, Vol. 36 Issue 11, p1-1, 1p