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pro vyhledávání: '"Takeshi Sano"'
Publikováno v:
Japanese Journal of Applied Physics. 34:L824
The influence of the emission site on the running durability of organic electroluminescent devices was examined. The fundamental device structure of MgIn/BeBq2/TPD/MTDATA/ITO ( BeBq2=bis(10-hydroxybenzo[h]quinolinato)beryllium, TPD=N,N′-diphenyl-N,