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Autor:
Augustinus J.H.M. Rijnders, Horst Rogalla, J. Gao, D. Terpstra, G.J. Gerritsma, Y.M. Boguslavskij
Publikováno v:
IEEE Transactions on Applied Superconductivity. 3:2034-2037
The mechanisms of current passage and the causes of I/sub c/R/sub n/ (critical-current normal-resistance) product reduction of YBCO/PBCO/YBCO ramp-type junctions are analyzed. At PBCO (PrBa/sub 2/Cu/sub 3/O/sub x/) barrier thicknesses L=8-20 nm the j