Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Jin, P."'
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 5, Pp 802-811 (2024)
Determining threshold values in model based fault detection (MBFD) is a longstanding challenge, which is often addressed through empirical and ambiguous adjustments. To tackle this issue, this paper proposes an uncertainty-informed framework for quan
Externí odkaz:
https://doaj.org/article/82b2d22d2d5f44368c63a3aa28444279
Autor:
Jinan Zhang, Lulu Guo, Jin Ye, Annarita Giani, Ahmed Elasser, Wenzhan Song, Jianzhe Liu, Bo Chen, H. Alan Mantooth
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 4, Pp 658-673 (2023)
In this article, a machine learning technique is proposed for the detection of cyber-attacks in Photovoltaic (PV) farms using point of common coupling (PCC) sensors alone. A comprehensive cyber-attack model of a PV farm is first developed to consider
Externí odkaz:
https://doaj.org/article/dd07a0a55737452681c4fe5cb680c137
Autor:
Jin Huang, Kaicheng Li
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 4, Pp 208-220 (2023)
In three-phase inverters, high output common-mode voltage (CMV) will bring many negative effects. The active filter with a capacitive voltage divider (CVD) can effectively suppress the peaks of CMV both in the time-domain and frequency-domain. In pra
Externí odkaz:
https://doaj.org/article/1d19e4a2872f4859a0442149e6883aa3
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 3, Pp 391-401 (2022)
Battery-equipped apparatuses, such as electric vehicles (EVs), renewable energy generations, and mobile devices, are widely used and still being developed. For the design and evaluation of these devices, there is a growing demand for dc power supplie
Externí odkaz:
https://doaj.org/article/9701bf18030c4762a9b79a7036b9297a
Autor:
Boxue Hu, Zhuo Wei, Haoyang You, Risha Na, Rui Liu, Han Xiong, Pengyu Fu, Julia Zhang, Jin Wang
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 2, Pp 225-235 (2021)
Medium-voltage (e.g., 10 kV rated) silicon carbide (SiC) devices have great potentials in medium-voltage variable speed drives. But their high switching dv/dt can increase the voltage stress on motor windings and cause partial discharges. This paper
Externí odkaz:
https://doaj.org/article/ac54adaa062544a5b60ff6179c9f9775