Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Messick, C."'
Autor:
Sik-Han Sob, Messick, C., Chih-Chang Chen, Chuan-Pu Liu, Bakel, B., Peterson, R., Sadwick, L.
Publikováno v:
IEEE 1995 International Integrated Reliability Workshop Final Report; 1996, p136-141, 6p
Assessing MOS gate oxide reliability on wafer level with ramped/constant voltage and current stress.
Publikováno v:
IEEE 1995 International Integrated Reliability Workshop Final Report; 1996, p81-91, 11p
Publikováno v:
IEEE 1995 International Integrated Reliability Workshop Final Report; 1996, p104-112, 9p
Publikováno v:
IEEE 1995 International Integrated Reliability Workshop Final Report; 1996, p72-80, 9p