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Publikováno v:
Diamond and Related Materials. :30-37
The method of electron-beam-induced current (EBIC) was used to visualize the defect sites on a p-type (boron-doped) diamond (001) film. For this purpose, an Ag-Schottky layer (~ 2 mm × ~ 2 mm × ~ 50 nm) was deposited on the oxygen-terminated p-type