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Autor:
Huijun Kong, Li Shi, Michael T. Pettes, Yong J. Lee, Anastassios Mavrokefalos, Jae Hun Seol, David W. Johnson, Matt Beekman, Qiyin Lin
Publikováno v:
Applied Physics Letters. 96:181908
The in-plane thermal conductivity is measured to be three times lower in misfit-layered [(PbSe)0.99]x(WSe2)x superlattice thin films than disordered-layered WSe2 because of interface scattering despite a higher cross-plane value in the former than th