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Publikováno v:
Applied Physics Letters. 114:223902
Highly oriented 0.90[PbZr0.53Ti0.47]0.10[La0.80Sc0.20]O3-δ (PLZTS) thin films deposited on La0.67Sr0.33MnO3 (LSMO) coated MgO (100) substrates were grown by pulsed laser deposition technique. Temperature dependent dielectric measurements on metal-fe
Autor:
Chao Chen, Haiwu Zhang, Hao Deng, Zhigao Hu, Ting Huang, Dong Wang, Xiaobing Li, Xiangyong Zhao, Haosu Luo
Publikováno v:
Applied Physics Letters. 104:142902
A micro-Raman scattering technique was used to investigate the electric-field and temperature dependent phase stability of Mn-doped Na1/2Bi1/2TiO3-5.0at. %BaTiO3 single crystal. The Ti–O mode was found to exhibit a slight shift at a low electric fi
Spectroscopic ellipsometry and Raman scattering study of the annealing behavior of Be‐implanted GaAs
Publikováno v:
Applied Physics Letters. 45:390-392
The annealing of the lattice damage induced by Be‐ion implantation in GaAs has been studied by spectroscopic ellipsometry and Raman scattering after each step of an isochronal thermal treatment. These two optical (i.e., nondestructive) techniques a