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pro vyhledávání: '"59"'
Autor:
V. Bouffetier, M. P. Valdivia, T. Goudal, Luke Ceurvorst, Sebastien Hulin, Fabien Dorchies, Alexis Casner, Dan Stutman
Publikováno v:
Applied optics
Applied optics, Optical Society of America, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, Optical Society of America, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Talbot–Lau x-ray interferometry is a grating-based phase-contrast technique, which enables measurement of refractive index changes in matter with micrometric spatial resolution. The technique has been established using a variety of hard x-ray sourc
Autor:
José Luis Rubio Guivernau, Massimo Mastrangeli, Aleksandar Jovic, Juan Sancho Durá, Kirill Zinoviev, Nuria Sanchez Losilla, E. Margallo-Balbas, Gregory Pandraud, Pasqualina M. Sarro
Publikováno v:
Applied Optics, 59(1)
In this work, we present the fabrication technology of a monolithically integrated photonic platform combining key components for optical coherence tomography (OCT) imaging, thereby including a photonic interferometer, a collimating lens, and a 45◦