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Autor:
V. Bouffetier, M. P. Valdivia, T. Goudal, Luke Ceurvorst, Sebastien Hulin, Fabien Dorchies, Alexis Casner, Dan Stutman
Publikováno v:
Applied optics
Applied optics, Optical Society of America, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, Optical Society of America, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Talbot–Lau x-ray interferometry is a grating-based phase-contrast technique, which enables measurement of refractive index changes in matter with micrometric spatial resolution. The technique has been established using a variety of hard x-ray sourc