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pro vyhledávání: '"Huazhong Yang"'
Publikováno v:
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Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate PMOS NBTI model, in which the temperature variation and the ratio of a
Publikováno v:
ISQED
In the past, dynamic voltage and frequency scaling (DVFS) has been widely used for power and energy optimization in embedded system design. As thermal issues become increasingly prominent, we propose design-time thermal optimization techniques for em
Publikováno v:
8th International Symposium on Quality Electronic Design (ISQED'07); 2007, p204-209, 6p
Publikováno v:
8th International Symposium on Quality Electronic Design (ISQED'07); 2007, p139-144, 6p