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pro vyhledávání: '"Huazhong Yang"'
Publikováno v:
SoCC
In this paper, we investigate the impact of process variation on soft error vulnerability with Monte Carlo analysis. Our simulation results show that Qcritical variation (3sigma/mean) of four types of storage circuits caused by process variation can
Publikováno v:
2006 IEEE International SOC Conference; 2006, p243-246, 4p