Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Reichenberg A."'
Publikováno v:
Review of scientific instruments 76, 106108 (2005). doi:10.1063/1.2090367
We report on the influence of system-immanent asymmetries on the interpretation of in-plane piezoresponse force microscopy (PFM). As PFM is a surface scanning method, the electromechanical interaction of probe tip and sample is a key aspect of all ex
Autor:
Rainer Waser, Byung Joon Choi, Seol Choi, K. Szot, S. Tiedke, B. Reichenberg, Seong Keun Kim, Cheol Seong Hwang, Doo Seok Jeong, J. H. Oh, C. Rohde, Honggon Kim
Publikováno v:
Journal of applied physics 98, 33715 (2005). doi:10.1063/1.2001146
The resistive switching mechanism of 20- to 57-nm-thick TiO2 thin films grown by atomic-layer deposition was studied by current-voltage measurements and conductive atomic force microscopy. Electric pulse-induced resistance switching was repetitively
Publikováno v:
Review of scientific instruments 76, 046101 (2005). doi:10.1063/1.1878153
The in-plane image of piezoresponse force microscopy (PFM) generally exhibits a higher resolution and less noise than the out-of-plane image. Geometrical considerations indicate that the optical in-plane amplification is approximate to 40 times large