Zobrazeno 1 - 1
of 1
pro vyhledávání: '"77"'
Autor:
G. M. von Staszewski, R. Wollrab
Publikováno v:
Future Infrared Detector Materials.
A strong reduction of the n+-accumulation layer in n-Hgl-xCdxTe (MCT) samples after UV-irradiation was recently reported l 2 3 4. This effect produced by electron trapping in deep levels of the passivation oxide, lasts several hours at 77 K and even