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Autor:
Kazunori Komorita
Publikováno v:
Fourth International Conference on Thin Film Physics and Applications.
By using the MOM device of Bi203 filiiis, soiiie electrical properties on these filiiis or the device are studied as follows; (1) The behavior of the electric current across the thickBi203 filius under DC field, is elucidated by the formula IccV for