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Autor:
V. Bouffetier, M. P. Valdivia, T. Goudal, Luke Ceurvorst, Sebastien Hulin, Fabien Dorchies, Alexis Casner, Dan Stutman
Publikováno v:
Applied optics
Applied optics, Optical Society of America, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, Optical Society of America, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Applied optics, 2020, 59 (27), pp.8380. ⟨10.1364/AO.398839⟩
Talbot–Lau x-ray interferometry is a grating-based phase-contrast technique, which enables measurement of refractive index changes in matter with micrometric spatial resolution. The technique has been established using a variety of hard x-ray sourc
Publikováno v:
Applied Optics
Jamal, M T & Hansen, A K 2020, ' Practical, open source, GPU-accelerated, high-fidelity phase retrieval by simultaneous propagations ', Applied Optics, vol. 59, no. 34, 10761, pp. 10761-10767 . https://doi.org/10.1364/AO.402859
Jamal, M T & Hansen, A K 2020, ' Practical, open source, GPU-accelerated, high-fidelity phase retrieval by simultaneous propagations ', Applied Optics, vol. 59, no. 34, 10761, pp. 10761-10767 . https://doi.org/10.1364/AO.402859
Phase retrieval is a highly useful technique that allows the calculation of the complex electric field of a beam of spatially coherent radiation based only on recordings of intensity profiles with a camera. In this work, we demonstrate what we believ
Publikováno v:
Applied Optics Vol. 59, Issue 13, pp. D81-D88 (2020)
Recent methods for phase unwrapping in the presence of noise include denoising algorithms to filter out noise as a preprocessing stage. However, including a denoising stage increases the overall computational complexity resulting in long execution ti
Publikováno v:
Applied Optics, 59(20)
The development of actinic mask metrology tools represents one of the major challenges to be addressed on the roadmap of extreme ultraviolet (EUV) lithography. Technological advancements in EUV lithography result in the possibility to print increasin