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pro vyhledávání: '"Sun, Jin"'
Autor:
Sun, Jin
As device feature sizes shrink to nano-scale, continuous technology scaling has led to a large increase in parameter variability during semiconductor manufacturing process. According to the source of uncertainty, parameter variations can be classifie
Externí odkaz:
http://hdl.handle.net/10150/145458
Autor:
Sun, Jin
Publikováno v:
Click to view the E-thesis via HKUTO.
Thesis (Ph. D.)--University of Hong Kong, 2009.
Includes bibliographical references (p. 238-268). Also available in print.
Includes bibliographical references (p. 238-268). Also available in print.
Externí odkaz:
http://sunzi.lib.hku.hk/hkuto/record/B42664652
published_or_final_version
Education
Doctoral
Doctor of Philosophy
Education
Doctoral
Doctor of Philosophy
Autor:
Sun, Jin.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.
Source: Dissertation Abstracts International, Volume: 69-05, Section: B, page: 3193. Adviser: Paul Scott Carney. Includes bibliographical references (leaves 54-56) Available on mi
Source: Dissertation Abstracts International, Volume: 69-05, Section: B, page: 3193. Adviser: Paul Scott Carney. Includes bibliographical references (leaves 54-56) Available on mi
Autor:
Sun, Jin.
Thesis (Ph.D.)--Iowa State University, 2007.
Title from PDF title page (viewed on April 25, 2007) Includes bibliography.
Title from PDF title page (viewed on April 25, 2007) Includes bibliography.