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pro vyhledávání: '"621.39"'
Autor:
Lin, Yang
The aggressive scaling of semiconductor devices has caused a significant increase in the soft error rate induced by radiation particle strikes. This has led to an increasing need for soft error tolerance techniques to maintain system reliability, eve
Externí odkaz:
https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.668789
Autor:
Li, Shaobai
The prospect of emulating the impressive computational capacities of biological systems has led to much interest in the design of analog circuits, potentially implementable in VLSI CMOS technology, that are guided by biologically motivated models. Ho
Externí odkaz:
https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.635503
Autor:
Almutairi, Bader
This research discusses the theoretical investigation, simulation and hardware implementation of the ElectroMechanical Multi-stAge noise SHaping (EM-MASH) sigma delta modulator (ΣΔM). The potential advantages of an EM-ΣΔM MASH compared to single-
Externí odkaz:
https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.658812