Zobrazeno 241 - 250
of 581 665
pro vyhledávání: '"785"'
Publikováno v:
Asian Business & Management; Feb2024, Vol. 23 Issue 1, p55-81, 27p
Autor:
van Berkel, Sheila R., Prevoo, Mariëlle J. L., Linting, Mariëlle, Pannebakker, Fieke, Alink, Lenneke R. A.
Publikováno v:
Child Maltreatment; Feb2024, Vol. 29 Issue 1, p53-65, 13p
Autor:
Silva, G. A. P., Kummerle, A. E., Antunes, F., Fraga, C. A. M., Barreiro, E. J., Zapata-Sudo, G., Sudo, R. T.
Publikováno v:
Brazilian Journal of Medical & Biological Research; Mar2013, Vol. 46 Issue 3, p263-269, 7p
Autor:
Yan, Ziling, Wang, Mengya, Shi, Mengke, He, Yang, Zhang, Yi, Qiu, Shihong, Yang, Hong, Chen, Huabing, He, Hui, Guo, Zhengqing
Publikováno v:
Journal of Materials Chemistry B; 8/21/2020, Vol. 8 Issue 31, p6886-6897, 12p
Publikováno v:
220 Triathlon; Feb2018, p30-31, 2p, 4 Color Photographs
Autor:
Cheng, Ji-Xin, Min, Wei, Simpson, Garth J., Rådmark, Magnus, Elgcrona, Gunnar, Karlsson, Håkan
Publikováno v:
Proceedings of SPIE; 11/11/2019, Vol. 11252, p112521A-112521A-7, 1p
Publikováno v:
Obstetrics & Gynecology; Sep2019, Vol. 134 Issue 3, p658-659, 2p
Autor:
Akman, Özkan, Ekici, Kübra
Publikováno v:
Proceedings of International Conference on Studies in Education & Social Sciences (ICSES); 11/10/2023, Vol. 1, p338-347, 10p
Publikováno v:
Plasmonics; Oct2022, Vol. 17 Issue 5, p2205-2211, 7p
785-nm Frequency Comb-Based Time-of-Flight Detection for 3D Surface Profilometry of Silicon Devices.
Publikováno v:
IEEE Photonics Journal; Oct2022, Vol. 14 Issue 5, p1-8, 8p