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Autor:
Nainani, Aneesh1, Irisawa, Toshifumi2, Yuan, Ze3, Bennett, Brian R.4, Boos, J. Brad4, Nishi, Yoshio5, Saraswat, Krishna C.5
Publikováno v:
IEEE Transactions on Electron Devices. Oct2011, Vol. 58 Issue 10, p3407-3415. 9p.